21 research outputs found
Study on reduction of pump Operation Expenses by Predicting Water Supply at Waterworks
departmental bulletin pape
Simulation of Dislocation Accumulation in ULSI Cells with STI structure
The periodic structure of the shallow trench isolation (STI) type ULSI cells is generally used for the latest semiconductor device structure. However, dislocations sometimes accumulate in the electron channel when the device size becomes small, and they have an enormous effect on the electronic state and obstruct the device from normal operation. In this paper, we numerically model the periodic structure of the STI type ULSI cells, and analyze the plastic slip that takes place during the oxidation process of oxide film area. The slip deformation is analyzed by a crystal plasticity analysis cord, which has been developed on the basis of finite element technique, and we evaluate the accumulation of dislocations that accompany plastic slip. The results show stress concentrations at the shoulder part of the device area and the bottom corners of the trench for the device isolation, and high stresses at these area cause plastic slip and dislocation accumulation. The direction of these dislocation lines are shown to be mostly parallel to the trench direction and dislocations are approximately 60° mixed type.application/pdfjournal articl
誤用へのフィードバックと矯正率の推移 : インタビューの文字化資料を用いて
application/pdfThis study attempts to examine the learner's ability of self-error correction and its transition and clarify the relationship between feedback to errors and the error rate. In this study were performed 5 interviews for intermediate and advanced learners over a period of 9 months. After each interview, the learners corrected their own transcriptions based on the interview, and took explanations of their errors. This procedure has provided some results shown as follows. 1. The feedback has an effect upon the needless particle “no” which is used behind the verbs and the adjectives, “temo” indicating condition. 2. The feedback has no effect upon the particle “wa” indicating comparison.departmental bulletin pape
Growth property of 5 Carex species transplanted on an excavation slope
のり面におけるスゲ属植物の緑化利用を目的として,信州大学農学部周辺に自生する陸生スゲ類5種(コジュズスゲ,タガネソウ,ヒゴクサ,ミヤマカンスゲ,アズマナルコ)を用い,切土のり面への植栽を行って生長特性を解析した。植栽は2005年6月に実施し,株数と被度を2005年10月,2006年6月,2006年11月に測定した。株数増加率と被度増加率で比較したところ,1株が大型化するもの,地下の匐枝により株数を増大させるもの,その中間というように,5種の栄養生長は大きく異なっていた。また,秋冬の越冬期について,株数でみた越冬率に対し,被度増加率は対数関数的に増加しており,現存の群落の被度を維持するためには越冬率90%以上が必要と推測された。生育期間ごとの被度の変化を分析したところ,植栽1年後ごろに被度100%に達するプロットが現れ,種間の競合が顕著になることが判明した。Article信州大学農学部AFC報告 5: 101-106 (2007)journal articl
Among individuals in households with at least one ITN, percent who slept under an ITN the night before the survey, by intra-household access status, five-year age category, and gender, Sierra Leone, 2011.
<p>Among individuals in households with at least one ITN, percent who slept under an ITN the night before the survey, by intra-household access status, five-year age category, and gender, Sierra Leone, 2011.</p
Logistic regression model assessing the associations between socio-demographic and knowledge characteristics with ITN use, among those in households with ≥1 ITN (n = 22,344), Sierra Leone, 2011.
<p>Model also controls for district; standard errors estimated with the Taylor Series Linearization method.</p><p>AOR: Adjusted odds ratio.</p><p>CI: Confidence interval.</p>*<p>p<0.10; **P<0.05; ***P<0.001.</p
Household possession of ITNs (LLIN and ITN) by socio-demographic and malaria knowledge characteristics (n = 4,610), Sierra Leone, 2011.
<p>Taylor Series Linearization approach used for standard error estimation and accompanying Rao-Scott <i>X<sup>2</sup></i> test statistics.</p><p>CI: Confidence interval.</p
Logistic regression models assessing the associations between socio-demographic and knowledge characteristics with household ITN deployment, among households with ≥1 ITN (n = 4,088), Sierra Leone, 2011.
<p>Model also controls for district; standard errors estimated with the Taylor Series Linearization method.</p><p>AOR: Adjusted odds ratio.</p><p>CI: Confidence interval.</p>*<p>p<0.10; **P<0.05; ***P<0.001.</p
