4 research outputs found
A Study on the Adaptation Process About Sexually Abused Children by Kin and Kith - With a Focus on the Children at the Shelter -
No full textAtomic force microscopy for surface imaging and characterization of supported nanostructures
No full textThis chapter presents an overview of Atomic Force Microscopy (AFM) principles followed by details on AFM instrumentation. In particular, the frequency modulation method of the non-contact AFM (NC-AFM) used in ultra-high vacuum conditions is explained in detail. Then, applications of NC-AFM for an atomic-scale range characterization of semiconductor and isolator surfaces as well as supported nanostructures are introduced
