Optical and structural characterization of Ge clusters embedded in ZrO2

The change of optical and structural properties of Ge nanoclusters in ZrO2 matrix have been investigated by spectroscopic ellipsometry versus annealing temperatures. Radio-frequency top-down magnetron sputtering approach was used to produce the samples of different types, i.e. single-layers of pure Ge, pure ZrO2 and Ge-rich-ZrO2 as well as multi-layers stacked of 40 periods of 5-nm-Ge-rich-ZrO2 layers alternated by 5-nm-ZrO2 ones. Germanium nanoclusters in ZrO2 host were formed by rapid-thermal annealing at 600-800 ∘C during 30 s in nitrogen atmosphere. Reference optical properties for pure ZrO2 and pure Ge have been extracted using single-layer samples. As-deposited multi-layer structures can be perfectly modeled using the effective medium theory. However, annealed multi-layers demonstrated a significant diffusion of elements that was confirmed by medium energy ion scattering measurements. This fact prevents fitting of such annealed structure either by homogeneous or by periodic multi-layer model

[ポスター2]高温展開から見た異方的超伝導(異方的超伝導現象の統一的理解を目指して,京都大学基礎物理学研究所 研究会,研究会報告)

この論文は国立情報学研究所の電子図書館事業により電子化されました。アブストラク

Interactions between Leptosphaeria maculans, L. biglobosa and fungicides in oilseed rape

Non peer reviewe