Power Limiter with PIN Diode Embedded in Cavity to Minimize Parasitic Inductance

This letter introduces a power limiter that limits the input power to protect the receiver when a large power enters the radio frequency receiver. When the power limiter receives a large power signal, a positive-intrinsic-negative (PIN) diode is turned on to limit the input power by lowering the impedance. We analyzed the characteristics of the power limiter according to the method of connecting the PIN diode in parallel with the input and output transmission lines of the power limiter. By embedding a PIN diode into the cavity and minimizing the length of the wire, a power limiter was designed and implemented to minimize parasitic inductance. In the S-band, the proposed power limiter’s insertion loss was below 0.5 dB, and the reflection loss characteristics were below 15 dB. Furthermore, it achieved an output P1dB of 21.8 dBm at 3.5 GHz

LTCC-Based DC-DC Converter for Reduction of Switching Noise and Radiated Emissions

In this study, a low-temperature co-fired ceramic (LTCC)-based direct current (DC)-DC converter is proposed for reducing stray inductance and mitigating electromagnetic interference. The dominant radiating loop of the proposed LTCC-based DC-DC converter features a multilayer design, which helps suppress noise sources and reduce radiated emissions. The peak voltage of switching noise for the proposed DC-DC converter at the frequency of 500 kHz is approximately 8.98% lower than that of a conventional DC-DC converter. In addition, the radiated emission level of the proposed DC-DC converter is lower than that of the conventional DC-DC converter. In sum, the proposed LTCC-technology-based multilayer design reduces the peak voltage of switching noise and the radiated emission of the DC-DC converter

Nonuniformity-Immune Read-In Integrated Circuit for Infrared Sensor Testing Systems

In this study, a novel IR projector driver that can minimize nonuniformity in electric circuits, using a dual-current-programming structure, is proposed to generate high-quality infrared (IR) scenes for accurate sensor evaluation. Unlike the conventional current-mode structure, the proposed system reduces pixel-to-pixel nonuniformity by assigning two roles (data sampling and current driving) to a single transistor. A prototype of the proposed circuit was designed and fabricated using the SK-Hynix 0.18 µm CMOS process, and its performance was analyzed using post-layout simulation data. It was verified that nonuniformity, which is defined as the standard deviation divided by the mean radiance, could be reduced from 21% to less than 0.1%

Nonuniformity-Immune Read-In Integrated Circuit for Infrared Sensor Testing Systems

In this study, a novel IR projector driver that can minimize nonuniformity in electric circuits, using a dual-current-programming structure, is proposed to generate high-quality infrared (IR) scenes for accurate sensor evaluation. Unlike the conventional current-mode structure, the proposed system reduces pixel-to-pixel nonuniformity by assigning two roles (data sampling and current driving) to a single transistor. A prototype of the proposed circuit was designed and fabricated using the SK-Hynix 0.18 µm CMOS process, and its performance was analyzed using post-layout simulation data. It was verified that nonuniformity, which is defined as the standard deviation divided by the mean radiance, could be reduced from 21% to less than 0.1%.</jats:p