7 research outputs found
TCAD Simulation of Data Retention Characteristics of Charge Trap Device for 3-D NAND Flash Memory
Full text linkAn abnormal floating gate interference and a low program performance in 2y nm NAND flash devices
Full text linkNew Read Scheme of Variable Vpass-Read for Dual Control Gate with Surrounding Floating Gate (DC-SF) NAND Flash Cell
Full text linkAdvanced Hot-Carrier Injection Programming Scheme for Sub 20nm NAND Flash Cell and beyond
Full text linkModeling and optimization of the chip level program disturbance of 3D NAND Flash memory
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