Models of MOS and SOS devices

Quarterly report describes progress in three programs: dc sputtering machine for aluminum and aluminum alloys; two dimensional computer modeling of MOS transistors; and development of computer techniques for calculating redistribution diffusion of dopants in silicon on sapphire films

Dynamic assertion testing of flight control software

An experiment in using assertions to dynamically test fault tolerant flight software is described. The experiment showed that 87% of typical errors introduced into the program would be detected by assertions. Detailed analysis of the test data showed that the number of assertions needed to detect those errors could be reduced to a minimal set. The analysis also revealed that the most effective assertions tested program parameters that provided greater indirect (collateral) testing of other parameters

Executable assertions and flight software

Executable assertions are used to test flight control software. The techniques used for testing flight software; however, are different from the techniques used to test other kinds of software. This is because of the redundant nature of flight software. An experimental setup for testing flight software using executable assertions is described. Techniques for writing and using executable assertions to test flight software are presented. The error detection capability of assertions is studied and many examples of assertions are given. The issues of placement and complexity of assertions and the language features to support efficient use of assertions are discussed

Dynamic assertion testing of flight control software

Digital Flight Control System (DFCS) software was used as a test case for assertion testing. The assertions were written and embedded in the code, then errors were inserted (seeded) one at a time and the code executed. Results indicate that assertion testing is an effective and efficient method of detecting errors in flight software. Most errors are eliminate at an earlier stage in the development than before

A study of trends and techniques for space base electronics

A sputtering system was developed to deposit aluminum and aluminum alloys by the dc sputtering technique. This system is designed for a high level of cleanliness and for monitoring the deposition parameters during film preparation. This system is now ready for studying the deposition and annealing parameters upon double-level metal preparation. A technique recently applied for semiconductor analysis, the finite element method, was studied for use in the computer modeling of two dimensional MOS transistor structures. It was concluded that the method has not been sufficiently well developed for confident use at this time. An algorithm was developed for confident use at this time. An algorithm was developed for implementing a computer study which is based upon the finite difference method. The program which was developed was modified and used to calculate redistribution data for boron and phosphorous which had been predeposited by ion implantation with range and straggle conditions. Data were generated for 111 oriented SOS films with redistribution in N2, dry O2 and steam ambients

The origin of exciton mass in a frustrated Mott insulator Na2_2IrO3_3

We use a three-pulse ultrafast optical spectroscopy to study the relaxation processes in a frustrated Mott insulator Na$_2$IrO$_3$. By being able to independently produce the out-of-equilibrium bound states (excitons) of doublons and holons with the first pulse and suppress the underlying antiferromagnetic order with the second one, we were able to elucidate the relaxation mechanism of quasiparticles in this system. By observing the difference in the exciton dynamics in the magnetically ordered and disordered phases we found that the mass of this quasiparticle is mostly determined by its interaction with the surrounding spins