46 research outputs found

    Calculation of atomic spontaneous emission rate in 1D finite photonic crystal with defects

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    We derive the expression for spontaneous emission rate in finite one-dimensional photonic crystal with arbitrary defects using the effective resonator model to describe electromagnetic field distributions in the structure. We obtain explicit formulas for contributions of different types of modes, i.e. radiation, substrate and guided modes. Formal calculations are illustrated with a few numerical examples, which demonstrate that the application of effective resonator model simplifies interpretation of results.Comment: Cent. Eur. J. Phys, in pres

    Angular and Temperature Tuning of Emission from Vertical-External-Cavity Surface-Emitting Lasers (VECSELs)

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    In this paper we demonstrate how the tuning of the VECSEL heterostructure can be precisely determined. Since the VECSEL active region is embodied in a microcavity, the photoluminescence signal collected from the chip surface is modified by the resonance of this cavity. The angle resolved photoluminescence measurements combined with the temperature tuning of the structure allowed us to precisely determine VECSEL emission features. The investigated structure consists of GaAs cavity with six InGaAs quantum wells and is designed for lasing at 980 nm. Introduction Vertical-external-cavity surface-emitting lasers (VECSELs

    Optoelectronic Devices Employing One-Dimensional Photonic Structures

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    This paper reviews the experimental and theoretical results obtained during work on the modern semiconductor devices employing one-dimensional photonic structures. After short review of the physical features of structures consisting of 1D stack of the alternating high and low index layers, particular attention will be given to unique features of the devices employing microcavities: resonant cavity LEDs, resonant-cavity enhanced photo-detectors, vertical cavity surface emitting lasers, and also vertical external cavity surface emitting lasers. At the end the semiconductor saturable absorber mirrors are discussed

    Measurement of linewidth enhancement factor in self-assembled quantum dot semiconductor lasers emitting at 1310 nm

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    Measurements of the linewidth enhancement factor (also termed the aparameter) for quantum dot semiconductor lasers emitting at 1310 nm in both single and multiple transverse modes are presented. Values between 1.5 and 3.0 were measured depending on the device length. In addition, its spectral dependence within the inhomogeneously broadened ground and excited state is investigated

    Optoelectronic Devices Employing One-Dimensional Photonic Structures

    No full text
    This paper reviews the experimental and theoretical results obtained during work on the modern semiconductor devices employing one-dimensional photonic structures. After short review of the physical features of structures consisting of 1D stack of the alternating high and low index layers, particular attention will be given to unique features of the devices employing microcavities: resonant cavity LEDs, resonant-cavity enhanced photo-detectors, vertical cavity surface emitting lasers, and also vertical external cavity surface emitting lasers. At the end the semiconductor saturable absorber mirrors are discussed

    Ultrashort pulses supported by SESAM absorber

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    We have developed a mode-locked diode-pumped Yb:KYW laser generating nearly band-width limited pulses as short as 101 fs. At 1.1 W absorbed power and 3% transmission output coupler, the laser delivers 150 mW for pulse duration of 110 fs, what corresponds to an efficiency of 14%. It was achieved using semiconductor saturable absorber mirror (SESAM) grown by molecular beam epitaxy. SESAM contains a distributed Bragg reflector (DBR) completed by single quantum well (SQW) playing role of an absorbing layer. The absorbers were crystallized in accordance with the predicted structure parameters under optimised growth conditions. The resonant-like type of structures ensured relatively high enhancement factor due to antireflective properties of SiO2 capping material and a wavelength independence of a group delay dispersion. The optimisation of the growth conditions of both an absorbing layer and DBR structure were widely carried out. Optical reflectance and high resolution X-ray diffraction have been used for characterization and verification of DBR structures. It results in reduction of the nonsaturable absorption in SESAM and self-starting mode-locking of the ultrashort pulses
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