Income inequalities under economic restructuring in Hong kong

Hong Kong's income inequalities have long been situated at a relatively high level by international standards. This paper investigates the factors that have contributed to this prolonged phenomenon. We argue that in the absence of appropriate government actions, economic progress in a laissez-faire capitalist system cannot necessarily equalize income distribution. © 2004 by The Regents of the University of California.link_to_subscribed_fulltex

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Generation of high power test vector set for combinational VLSI circuits

Burn-in is a well-known technique that helps to accelerate failure mechanisms to surface out latent defects, which are not activated during normal testing of the VLSI devices. The devices are kept at a specified high temperature, for a specified period, in static or dynamic conditions. Since this method is cumbersome, an alternate method based on complementary metal oxide semiconductor (CMOS) signal switching for VLSI devices is,considered. The majority of power dissipation in CMOS circuitry is due to the switching current associated with charging and discharging of load capacitances. Hence, if the test vectors can be so designed that maximum activity is conjured, the stress on the device can be maximised. In this paper, a new algorithm for generation of these power vectors from a gate-level description of the circuit is presented. The method has been applied to different circuits and the results compared

Globalization and the dominance of large cities in contemporary China

Since the introduction of the economic reforms in late 1978, the Chinese urban system has experienced spectacular growth, accompanied by a rapid rise of urbanization from about 20% to more than 36%. Although restricted by government policy, the development of large cities prevailed in the 1980s, as shown in a previous study (Zhao and Zhang, 1995). This process of predominantly large cities growth appeared to continue in the 1990s, as is shown with further analysis and update on the issue, within the framework of globalization and other economic theories. Based on newly published demographic and economic data, the paper depicts the growth and concentration of population, foreign direct investment and employment availability in the large cities in contemporary China. This paper argues that in this globalization process, in which the fundamental economic rationales of increasing returns, urbanization economies and urbanization agglomeration prevail, large cities will continue to outperform the small cities and so the dominance of large cities will continue. © 2003 Elsevier Science Ltd. All rights reserved.link_to_subscribed_fulltex

Globalization and Urban Dominance of Large Cities in Contemporary China

本文在全球化和有關經濟理論研究的框架下,對當前中國城市體系運作中大城市占據主導地位的事實和理論基礎進行了評價和解釋。基于最新的人口和經濟的統計數據,本文對當代中國大城市人口的增長和集聚、外商直接投資及提供就業等方面進行了描述。結論是,大城市相對于小城市來說仍然擁有發展的優勢,將繼續占據主導地位。This paper provides further analysis and updates on the process of predominant large cities’ growth within the framework of globalization and the economic theories. Based on the newly published demographic and economic data,the paper depicts the growth and concentration of population, foreign direct investment and employment availability in the large cities. The finding of this paper argues that the growth of large cities out perform the small cities and the dominance of large cities will continue

Development of an abstract model for a non-volatile static random access memory

The capability to protect against power fluctuations, which eventually prevents the corruption of the memory contents makes non-volatile static random access memory a very good choice for use in highly reliability applications. These random access memories are protected against data writing in addition to preserving the desired contents. Energy source and control circuitries are embedded into it for achieving the same. The control circuitry constantly monitors supply voltage level, inhibits data corruption, and switches on the energy Source once it falls beyond a threshold level. In this paper, development of an abstract model for such a non-volatile static random access memory chip has been presented. Test sequences based on this model have been generated for this memory chip. These test sequences have been implemented in VLSI tester and exercised on the chips