Unambiguous interpretation of atomically resolved force microscopy images of an insulator

The (111) surface of CaF 2 was imaged with dynamic mode scanning force microscopy and modeled using atomistic simulation. Both experiment and theory showed a clear triangular contrast pattern in images, and theory demonstrated that the contrast pattern is due to the interaction of a positive electrostatic potential tip with fluorine ions in the two topmost surface layers. We find a good agreement of position and relative height of scan line features between theory and experiment and thus establish for the first time an unambiguous identification of sublattices of an insulator imaged by force microscopy

Investigating Atomic Details of the CaF2_2(111) Surface with a qPlus Sensor

The (111) surface of CaF$_2$ has been intensively studied with large-amplitude frequency-modulation atomic force microscopy and atomic contrast formation is now well understood. It has been shown that the apparent contrast patterns obtained with a polar tip strongly depend on the tip terminating ion and three sub-lattices of anions and cations can be imaged. Here, we study the details of atomic contrast formation on CaF$_2$(111) with small-amplitude force microscopy utilizing the qPlus sensor that has been shown to provide utmost resolution at high scanning stability. Step edges resulting from cleaving crystals in-situ in the ultra-high vacuum appear as very sharp structures and on flat terraces, the atomic corrugation is seen in high clarity even for large area scans. The atomic structure is also not lost when scanning across triple layer step edges. High resolution scans of small surface areas yield contrast features of anion- and cation sub-lattices with unprecedented resolution. These contrast patterns are related to previously reported theoretical results.Comment: 18 pages, 9 Figures, presented at 7th Int Conf Noncontact AFM Seattle, USA Sep 12-15 2004, accepted for publication in Nanotechnology, http://www.iop.or

Unambiguous Interpretation of Atomically Resolved Force Microscopy Images of an Insulator

The (111) surface of CaF2 was imaged with dynamic mode scanning force microscopy and modeledusing atomistic simulation. Both experiment and theory showed a clear triangular contrast pattern in images, and theory demonstrated that the contrast pattern is due to the interaction of a positive electrostatic potential tip with fluorine ions in the two topmost surface layers. We find a good agreement of position and relative height of scan line features between theory and experiment and thus establish for the first time an unambiguous identification of sublattices of an insulator imaged by force microscopy.Peer reviewe

Role of tip structure and surface relaxation in atomic resolution dynamic force microscopy: CaF2(111) as a reference surface

By combining experimental dynamic scanning force microscope (SFM) images of the CaF2(111) surface with an extensive theoretical modeling, we demonstrate that the two different contrast patterns obtained reproducibly on this surface can be clearly explained in terms of the change of the sign of the electrostatic potential at the tip end. We also present direct theoretical simulations of experimental dynamic SFM images of an ionic surface at different tip-surface distances. Experimental results demonstrate a qualitative transformation of the image pattern, which is fully reproduced by the theoretical modeling and is related to the character of tip-induced displacements of the surface atoms. The modeling of the image transformation upon a systematic reduction of the tip-surface distance with ionic tips allows an estimate of the tip-surface distance present in experiment, where 0.28–0.40 nm is found to be optimal for stable imaging with well-defined atomic contrast. We also compare the modeling with ionic tips to results for a pure silicon tip. This comparison demonstrates that a silicon tip can yield only one type of image contrast and that the tip-surface interaction is not strong enough to explain the image contrast observed experimentally. The proposed interpretation of two types of images for the CaF2(111) surface can also be used to determine the chemical identity of imaged features on other surfaces with similar structure.Peer reviewe

Transition Radiation Spectroscopy with Prototypes of the ALICE TRD

We present measurements of the transition radiation (TR) spectrum produced in an irregular radiator at different electron momenta. The data are compared to simulations of TR from a regular radiator.Comment: 4 pages, 5 Figures, Proceedings for "TRDs for the 3rd millennium" (Sept. 4-7, 2003, Bari, Italy

Thermal Properties of Graphene, Carbon Nanotubes and Nanostructured Carbon Materials

Recent years witnessed a rapid growth of interest of scientific and engineering communities to thermal properties of materials. Carbon allotropes and derivatives occupy a unique place in terms of their ability to conduct heat. The room-temperature thermal conductivity of carbon materials span an extraordinary large range - of over five orders of magnitude - from the lowest in amorphous carbons to the highest in graphene and carbon nanotubes. I review thermal and thermoelectric properties of carbon materials focusing on recent results for graphene, carbon nanotubes and nanostructured carbon materials with different degrees of disorder. A special attention is given to the unusual size dependence of heat conduction in two-dimensional crystals and, specifically, in graphene. I also describe prospects of applications of graphene and carbon materials for thermal management of electronics.Comment: Review Paper; 37 manuscript pages; 4 figures and 2 boxe

Atomic resolution force microscopy imaging on a strongly ionic surface with differently functionalized tips

金沢大学理工研究域数物科学系Three types of tips for noncontact atomic force microscopy imaging, namely, a silicon nanopillar tip, a carbon nanopillar tip, and a fluoride cluster tip, are prepared for atomic resolution imaging on the CaF2 (111) surface. The most enhanced atomic corrugation is obtained with the fluoride cluster tip prepared by gently touching the fluorite surface. Atom resolved images are much harder to obtain with the other tips. This demonstrates the importance of having a polar tip for atomic resolution imaging of an ionic surface and supports the general notion that a surface is best imaged with a tip of the same material. © 2010 American Vacuum Society