Helium ion microscopy and energy selective scanning electron microscopy – two advanced microscopy techniques with complementary applications

Both scanning electron microscopes (SEM) and helium ion microscopes (HeIM) are based on the same principle of a charged particle beam scanning across the surface and generating secondary electrons (SEs) to form images. However, there is a pronounced difference in the energy spectra of the emitted secondary electrons emitted as result of electron or helium ion impact. We have previously presented evidence that this also translates to differences in the information depth through the analysis of dopant contrast in doped silicon structures in both SEM and HeIM. Here, it is now shown how secondary electron emission spectra (SES) and their relation to depth of origin of SE can be experimentally exploited through the use of energy filtering (EF) in low voltage SEM (LV-SEM) to access bulk information from surfaces covered by damage or contamination layers. From the current understanding of the SES in HeIM it is not expected that EF will be as effective in HeIM but an alternative that can be used for some materials to access bulk information is presented

Bacterial contamination of table eggs and the influence of housing systems

With the introduction of alternative housing systems for laying hens in the EU, recent research has focussed on the bacterial contamination of table eggs, e.g. eggshell and egg content contamination. Contamination of eggshells with aerobic bacteria is generally higher for nest eggs from non-cage systems compared to nest eggs from furnished cages or eggs from conventional cages. Studies indicate limited or no systematic differences in eggshell contamination with aerobic bacteria between eggs laid in the nest boxes of furnished cages and eggs laid in conventional cages. The major differences found in experimental studies between cage- and non-cage systems are less pronounced under commercial conditions. The effect of housing system on eggshell contamination with specific groups of bacteria is variable. Limited information is available on the influence of housing system on egg content contamination. Recent research does not indicate large differences in egg content contamination between eggs from cage- and non-cage systems (ignoring outside nest and floor eggs). The microflora of the eggshell is dominated by Gram-positive bacteria, whereas Gram-negative bacteria are best equipped to overcome the antimicrobial defences of the egg content. Much of the research on eggshell and egg content contamination focuses on Salmonella, since infection with Salmonella enteritidis, resulting from the consumption of contaminated eggs or egg products, is still a major health problem. Observed Salmonella prevalence on the eggshell and in the egg content vary, depending on the fact whether investigations were based on randomly sampled table eggs or on eggs from naturally infected hens. The limited information available on other pathogens shows that they are exclusively isolated from the eggshell and not from the internal contents

Optical ptychography with extended depth of field

Ptychography is an increasingly popular phase imaging technique. However, like any imaging technique it has a depth of field that limits the volume of a thick specimen that can be imaged in focus. Here, we have proposed to extend the depth of field using a multislice calculation model; an optical experiment successfully demonstrates our proposal

Optimized organometal halide perovskite solar cell fabrication through control of nanoparticle crystal patterning

The addition of Hydrogen Iodide to organometal halide perovskite precursor solution at 1% by volume leads to a significant enhancement in power conversion efficiency (PCE) in inverted solar cell devices, increasing from 7.7% to 11.9% and 6.1% to 10.0% in spin-cast and spray-cast devices respectively. We directly attribute this improved device performance to increased thin-film surface coverage coupled with higher optical density. X-ray diffraction studies also reveal that the HI additive facilitates full conversion of the precursor material to the crystalline perovskite phase. From solution studies, we relate these changes in device performance to the presence and distribution of precursor aggregates that effectively pattern the formation of perovskite crystals during film formation

Angle selective backscattered electron contrast in the low-voltage scanning electron microscope: simulation & experiment for polymers

Recently developed detectors can deliver high resolution and high contrast images of nanostructured carbon based materials in low voltage scanning electron microscopes (LVSEM) with beam deceleration. Monte Carlo Simulations are also used to predict under which exact imaging conditions purely compositional contrast can be obtained and optimised. This allows the prediction of the electron signal intensity in angle selective conditions for back-scattered electron (BSE) imaging in LVSEM and compares it to experimental signals. Angle selective detection with a concentric back scattered (CBS) detector is considered in the model in the absence and presence of a deceleration field, respectively. The validity of the model prediction for both cases was tested experimentally for amorphous C and Cu and applied to complex nanostructured carbon based materials, namely a Poly(N-isopropylacrylamide)/Poly(ethylene glycol) Diacrylate (PNIPAM/PEGDA) semi-interpenetration network (IPN) and a Poly(3-hexylthiophene-2,5-diyl) (P3HT) film, to map nano-scale composition and crystallinity distribution by avoiding experimental imaging conditions that lead to a mixed topographical and compositional contrast

Quantitative secondary electron imaging for work function extraction at atomic level and layer identification of graphene

Two-dimensional (2D) materials usually have a layer-dependent work function, which require fast and accurate detection for the evaluation of their device performance. A detection technique with high throughput and high spatial resolution has not yet been explored. Using a scanning electron microscope, we have developed and implemented a quantitative analytical technique which allows effective extraction of the work function of graphene. This technique uses the secondary electron contrast and has nanometre-resolved layer information. The measurement of few-layer graphene flakes shows the variation of work function between graphene layers with a precision of less than 10meV. It is expected that this technique will prove extremely useful for researchers in a broad range of fields due to its revolutionary throughput and accuracy

Multi-slice ptychographic tomography

Ptychography is a form of Coherent Diffractive Imaging, where diffraction patterns are processed by iterative algorithms to recover an image of a specimen. Although mostly applied in two dimensions, ptychography can be extended to produce three dimensional images in two ways: via multi-slice ptychography or ptychographic tomography. Ptychographic tomography relies on 2D ptychography to supply projections to conventional tomographic algorithms, whilst multi-slice ptychography uses the redundancy in ptychographic data to split the reconstruction into a series of axial slices. Whilst multi-slice ptychography can handle multiple-scattering thick specimens and has a much smaller data requirement than ptychographic tomography, its depth resolution is relatively poor. Here we propose an imaging modality that combines the benefits of the two approaches, enabling isotropic 3D resolution imaging of thick specimens with a small number of angular measurements. Optical experiments validate our proposed method

Evolutionary determination of experimental parameters for ptychographical imaging

The Ptychographical Iterative Engine (PIE) algorithm is a recently developed novel method of Coherent Diffractive Imaging (CDI) that uses multiple overlapping diffraction patterns to reconstruct an image. This method has successfully produced high quality reconstructions at both optical and X-ray wavelengths but the need for accurate knowledge of the probe positions is currently a limiting factor in the production of high resolution reconstructions at electron wavelengths. This paper examines the shape of the search landscape for producing optimal image reconstructions in the specific case of electron microscopy and then shows how evolutionary search methods can be used to reliably determine experimental parameters in the electron microscopy case (such as the spherical aberration in the probe and the probe positions)