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    3 research outputs found

    Substrate Integrated Waveguide Diplexer Design

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    'IGI Global'
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    Measurement of Junction Depth in Sub-Micron Device Using SIMS Technique for Performance Estimation in RF Range

    Author
    Publication venue
    'IGI Global'
    Publication date
    Field of study
    No full text
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    Vocational Education Paradigm Transformation Through Information Technology

    Author
    Publication venue
    'IGI Global'
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    Field of study
    No full text
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