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2 research outputs found
Accelerated lifetime testing of p + n − n + photodiode
Author
D. Caldararu
E.A. Weis
+11 more
Gerth
Howes
Hudson
Lycoudes
M.M. Snyder
Mann
N. Croitoru
Nelson
O'Connor
Schroen
Sze
Publication venue
'Elsevier BV'
Publication date
Field of study
No full text
Crossref
Reliability of Die-Level Interconnections
Author
AW Adamson
C Giacomo Di
+62 more
C Soret
CC Huang
CF Felter
CG Sherley
CL Lau
CM Hsieh
CW Chen
D Montgomery
DP Bouldin
DS Peck
E Hart
EJE Forsyth
ES Meieran
G Giacomo Di
G Giacomo Di
G Giacomo Di
G Giacomo Di
G Giacomo Di
G Giacomo Di
G Giacomo Di
G Giacomo Di
G Giacomo Di
G Giacomo Di
G Giacomo Di
G Giacomo Di
G Giacomo Di
G Giacomo Di
GJ Gurp Van
GJ Hans
H Ewals
H Weyer
H Yoo
HB Huntington
HB Huntington
IA Blech
IA Blech
J Crank
JH Matlock
JTG Overbeck
KC Norris
KJ Lodge
KJ Puttlitz
KU Snowden
MC Shine
ML White
MS Cole
N Lycoudes
P Tobias
R Berriche
R Hogg
R Satoh
RJ Bird
RP Merrett
S Brunauer
SE Greer
SK Sen
SP Sim
SR Calabro
TK Hong
TS May
Y Adda
Y Okamoto
Publication venue
'Springer Science and Business Media LLC'
Publication date
01/01/2001
Field of study
No full text
Crossref
No full text
