Optimisation de la mesure de figures de pôles en diffraction X

Les conditions optimales de mesure de figures de pôles ont été recherchées en utilisant différentes variantes de montage (utilisation d'un monochromateur, détecteur en énergie dispersive, incidence réduite) et en analysant divers matériaux (alliage de cuivre, acier bas carbone, couches minces de TiN). La qualité des données mesurées dans chaque cas est estimée à partir des coefficients de compatibilité calculés.The best conditions for measuring pole figures have been sought by using several kinds of difraction arrangement (use of a monochromator, energy dispersive detector, reduced incidence) and by analysing several materials (copper alloy, low carbon steel, TiN thin films). The quality of the measured data is estimated from the compatibility coefficients which are calculated in each case

X-Ray Texture Measurement Using a Position Sensitive Detector

AbstractFor pole figure measurement the flat sample has to be tilted which leads to peak broadening and peak overlap in peak-reach diffraction spectra. Using a linear position sensitive detector /PSD/, complete diffraction spectra can be obtained in each sample orientation. Peak separation can then be done by Gaussian fitting. When measuring with a PSD, each diffraction peak corresponds to a particular diffraction vector. This has to be taken into consideration by a coordinate transformation. The PSD-method is the only practical method of texture measurement for materials with complex diffraction spectra.</jats:p