7,664 research outputs found

    Processing and characterization of epitaxial GaAs radiation detectors

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    GaAs devices have relatively high atomic numbers (Z=31, 33) and thus extend the X-ray absorption edge beyond that of Si (Z=14) devices. In this study, radiation detectors were processed on GaAs substrates with 110 μm\mu\textrm{m} - 130 μm\mu\textrm{m} thick epitaxial absorption volume. Thick undoped and heavily doped p+^+ epitaxial layers were grown using a custom-made horizontal Chloride Vapor Phase Epitaxy (CVPE) reactor, the growth rate of which was about 10 μm\mu\textrm{m}/h. The GaAs p+^+/i/n+^+ detectors were characterized by Capacitance Voltage (CVCV), Current Voltage (IVIV), Transient Current Technique (TCT) and Deep Level Transient Spectroscopy (DLTS) measurements. The full depletion voltage (VfdV_{\textrm{fd}}) of the detectors with 110 μm\mu\textrm{m} epi-layer thickness is in the range of 8 V - 15 V and the leakage current density is about 10 nA/cm2^2. The signal transit time determined by TCT is about 5 ns when the bias voltage is well above the value that produces the peak saturation drift velocity of electrons in GaAs at a given thickness. Numerical simulations with an appropriate defect model agree with the experimental results.Comment: 7 pages, 10 figures, 10th International Conference on Radiation Effects on Semiconductor Materials, Detectors and Devices (RESMDD14), 8-10 October, Firenze, Ital

    Novel Data Acquisition System for Silicon Tracking Detectors

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    We have developed a novel data acquisition system for measuring tracking parameters of a silicon detector in a particle beam. The system is based on a commercial Analog-to-Digital VME module and a PC Linux based Data Acquisition System. This DAQ is realized with C++ code using object-oriented techniques. Track parameters for the beam particles were reconstructed using off-line analysis code and automatic detector position alignment algorithm. The new DAQ was used to test novel Czochralski type silicon detectors. The important silicon detector parameters, including signal size distributions and signal to noise distributions, were successfully extracted from the detector under study. The efficiency of the detector was measured to be 95 %, the resolution about 10 micrometers, and the signal to noise ratio about 10.Comment: Talk from the 2003 Computing in High Energy and Nuclear Physics (CHEP03), La Jolla, Ca, USA, March 2003, 6 pages, LaTeX, 5 eps figures. PSN TUGP00
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