5 research outputs found

    SOURCE, DRAIN, AND GATE SERIES RESISTANCES AND ELECTRON SATURATION VELOCITY IN ION-IMPLANTED GAAS-FETS

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    We would like to thank R.Jiracek of SRC, Honeywell, for his help in the wafer testing. We also acknowledge useful and fruitful discussions of this work Dr.W.Frensley

    Charge-Coupled Devices

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    Experimental Models of Arthritis in Animals as Screening Tests for Drugs to Treat Arthritis in Man

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