8,498 research outputs found
Solicited and Unsolicited Credit Ratings: A Global Perspective
We conducted a global study of the long-term issuer ratings of nonfinancial firms from Standard and Poor's Ratings Services (S&P) for the period 1998–2003. Specifically, we focused on the solicited versus unsolicited ratings and sample-selection bias in the analysis. Unlike the literature, we adopted an improved method using Wooldridge’s instrumental-variable approach to mitigate the concern of specification errors in Heckman’s model. We found that the probability of seeking a long-term issuer rating is positively related to the size and profitability of the firm, and negatively related to the growth opportunities and debt levels of the firm. The credit rating is positively related to the sovereign rating, size, and profitability of the issuer, and negatively related to the debt ratio of the issuer. Consistent with the literature, we found sample-selection bias in credit ratings. Our findings suggest that the firms with solicited ratings seem to be more profitable, more liquid, and have lower leverage than the issuers with unsolicited ratings. After controlling for sample-selection bias and some key financial ratios, we found that unsolicited firms, on average, seem to have lower long-term issuer ratings.corporate long-term issuer ratings; solicited and unsolicited
Formation of long-lived, scarlike modes near avoided resonance crossings in optical microcavities
We study the formation of long-lived states near avoided resonance crossings
in open systems. For three different optical microcavities (rectangle, ellipse,
and semi-stadium) we provide numerical evidence that these states are localized
along periodic rays, resembling scarred states in closed systems. Our results
shed light on the morphology of long-lived states in open mesoscopic systems.Comment: 4 pages, 5 figures (in reduced quality), to appear in Phys. Rev. Let
Deviation from Snell's Law for Beams Transmitted Near the Critical Angle: Application to Microcavity Lasers
We show that when a narrow beam is incident upon a dielectric interface near
the critical angle for total internal reflection it will be transmitted into
the far-field with an angular deflection from the direction predicted by
Snell's Law, due to a phenomenon we call "Fresnel Filtering". This effect can
be quite large for the parameter range relevant to dielectric microcavity
lasers.Comment: 4 pages, 3 figures (eps), RevTeX 3.1, to be published in Optics
Letter
Higher rank numerical ranges of normal matrices
The higher rank numerical range is closely connected to the construction of
quantum error correction code for a noisy quantum channel. It is known that if
a normal matrix has eigenvalues , then its higher
rank numerical range is the intersection of convex polygons with
vertices , where . In this paper, it is shown that the higher rank numerical range of a
normal matrix with distinct eigenvalues can be written as the intersection
of no more than closed half planes. In addition, given a convex
polygon a construction is given for a normal matrix
with minimum such that . In particular, if
has vertices, with , there is a normal matrix with such that .Comment: 12 pages, 9 figures, to appear in SIAM Journal on Matrix Analysis and
Application
Radio Astronomy
Contains reports on one research project.National Aeronautics and Space Administration (Contract NAS5-21980
Enhanced depth resolution in optical scanning holography using a configurable pupil
The optical scanning holography (OSH) technique can capture all the three-dimensional volume information of an object in a hologram via a single raster scan. The digital hologram can then be processed to reconstruct individual sectional images of the object. In this paper, we present a scheme to reconstruct sectional images in OSH with enhanced depth resolution, where a spatial light modulator (SLM) is adopted as a configurable point pupil. By switching the SLM between two states, different Fresnel zone plates (FZPs) are generated based on the same optical system. With extra information provided by different FZPs, a depth resolution at 0.7 μm can be achieved.published_or_final_versio
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