Research on electronic ballast control IC

[[fileno]]2030177030026[[department]]電機工程學

Cost analysis in choosing group size when group testing for Potato virus Y in the presence of classification errors

In many areas of the world, Potato virus Y (PVY) is one of the most economically important disease problems in seed potatoes. In Taiwan, generation 2 (G2) class certified seed potatoes are required by law to be free of detectable levels of PVY. To meet this standard, it is necessary to perform accurate tests at a reasonable cost. We used a two-stage testing design involving group testing which was performed in Taiwan's Seed Improvement and Propagation Station to identify plants infected with PVY. At the first stage of this two-stage testing design, plants are tested in groups. The second stage involves no retesting for negative test groups and exhaustive testing of all constituent individual samples from positive test groups. In order to minimise costs while meeting government standards, it is imperative to estimate optimal group size. However, because of limited test accuracy, classification errors for diagnostic tests are inevitable; to get a more accurate estimate, it is necessary to adjust for these errors. Therefore, this paper describes an analysis of diagnostic test data in which specimens are grouped for batched testing to offset costs. The optimal batch size is determined by various cost parameters as well as test sensitivity, specificity and disease prevalence. Here, the Bayesian method is employed to deal with uncertainty in these parameters. Moreover, we developed a computer program to determine optimal group size for PVY tests such that the expected cost is minimised even when using imperfect diagnostic tests of pooled samples. Results from this research show that, compared with error free testing, when the presence of diagnostic testing errors is taken into account, the optimal group size becomes smaller. Higher diagnostic testing costs, lower costs of false negatives or smaller prevalence can all lead to a larger optimal group size. Regarding the effects of sensitivity and specificity, optimal group size increases as sensitivity increases; however, specificity has little effect on determining optimal group size. From our simulated study, it is apparent that the Bayesian method can truly update the prior information to more closely approximate the intrinsic characteristics of the parameters of interest. We believe that the results of this study will be useful in the implementation of seed potato certification programmes, particularly those which require zero tolerance for quarantine diseases in certified tubers

ANALYSIS OF NEAR EDGE FINE STRUCTURE AND ELECTRONIC POPULATIONS IN SAPPHIRE

AlL and OK near edge fine structures in sapphire are studied using electron energy loss microspectroscopy in a transmission electron microscope;an analysis of the electronic populations of atoms Al and O,and a comparison between different partial cross sections are given.We consider the ionization of an atom in a homogeneous solid to interpret the elemental effects in the ionization region near edges.The chemical effects in the region near edge onset are interpreted by using extended Hückel molecular orbital theory and Bloch's theorem including the effects of translation symmetry in crystals to calculate the electronic transitions from core-shell to unoccupied valence-shell.We also consider the additional chemical effects, which arise from the elastic backscattering of the atomic ionization waves by the atoms neighboring the exited atom,giving rise to the so-called extended fine structure in the ionization region.The agreement between the calculated results and the experimental energy loss spectra of sapphire from single-phase region is good.</jats:p

ANALYSIS ON ENERGY ABSORPTION EDGE AND ELECTRON POPULATIONS OF Al

A theoretical explanation for L core-shell absorption edge of electron energy loss spectrum of Al, an analysis of the electronic populations and a comparison between different partial cross sections are given. The edge was first normalized to the same atomic ionization cross section (per atom per electronvolt). The contributions for the cross section come from three respects:the first one is the electronic transitions from the core-shell to valence-shell calculated by extended Hückel band model, the second one is the final ionization state obtained by electron gas model, the third comes from the elastic backscatting of outgoing waves by the atoms that neighbor the excited atom. The agreement between the calculation result and the experimental result is good.</jats:p