933 research outputs found

    Simulação do impacto das atividades florestais na fragilidade potencial em plantios de pinus.

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    Este trabalho, realizado em uma área com povoamento de Pinus taeda, teve por objetivo simular e mapear a influência do valor de impacto das atividades florestais na fragilidade potencial. Variáveis do solo, de declividade do terreno, valor de impacto e de cobertura vegetal foram utilizadas para gerar os mapas. Os resultados expressos pelo modelo adotado mostraram que as áreas mais frágeis apresentam em sua maioria declividades superiores a 75 % e textura que variam de arenosa a média, e as áreas menos frágeis apresentam predominantemente relevo plano (até 3 %) e textura argilosa. Quando simulado o impacto das atividades florestais sobre esse ambiente, verificou-se que na maior parte da área (78 %) todas as atividades florestais podem ser realizadas sem influência na degradação do meio ambiente e para algumas áreas (11 %) o ambiente foi considerado menos frágil, em razão da presença de cobertura vegetal

    Reflectance anisotropy spectroscopy assessment of the MOVPE nucleation of GaInP on Germanium (100)

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    This work summarizes the observations made on the variation and time evolution of the reflectanceanisotropy signal during the MOVPE growth of GaInPnucleation layers on Germanium substrates. This in situ monitoring tool is used to assess the impact of different nucleation routines and reactor conditions on the quality of the layers grown. This comparison is carried out by establishing a correlation between reflectanceanisotropy signature at 2.1 eV and the morphology of the epilayers evaluated by atomic force microscopy (AFM). This paper outlines the potential of reflectanceanisotropy to predict, explore, and therefore optimize, the best growth conditions that lead to a high quality III–V epilayer on a Ge substrat

    Analysis of the surface state of epi-ready Ge wafers

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    The surface state of Ge epi-ready wafers (such as those used on III-V multijunction solar cells) supplied by two different vendors has been studied using X-ray photoemission spectroscopy. Our experimental results show that the oxide layer on the wafer surface is formed by GeO and GeO2. This oxide layer thickness differs among wafers coming from different suppliers. Besides, several contaminants appear on the wafer surfaces, carbon and probably chlorine being common to every wafer, irrespective of its origin. Wafers from one of the vendors show the presence of carbonates at their surfaces. On such wafers, traces of potassium seem to be present too

    Laser Applications

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    Contains research objectives and reports on three research projects.Joint Services Electronics Programs (U. S. Army, U. S. Navy, and U. S. Air Force) under Contract DAAB07-71-C-0300U. S. Air Force Office of Scientific Research (Contract F44620-71-C-0051)Naval Air Systems Comman

    Structural investigation of MOVPE-Grown GaAs on Ge by X-ray techniques

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    The selection of appropriate characterisation methodologies is vital for analysing and comprehending the sources of defects and their influence on the properties of heteroepitaxially grown III-V layers. In this work we investigate the structural properties of GaAs layers grown by Metal-Organic Vapour Phase Epitaxy (MOVPE) on Ge substrates – (100) with 6⁰ offset towards – under various growth conditions. Synchrotron X-ray topography (SXRT) is employed to investigate the nature of extended linear defects formed in GaAs epilayers. Other X-ray techniques, such as reciprocal space mapping (RSM) and triple axis ω-scans of (00l)-reflections (l = 2, 4, 6) are used to quantify the degree of relaxation and presence of antiphase domains (APDs) in the GaAs crystals. The surface roughness is found to be closely related to the size of APDs formed at the GaAs/Ge heterointerface, as confirmed by X-ray diffraction (XRD), as well as atomic force microscopy (AFM), and transmission electron microscopy (TEM)

    PHASE FIELD CRYSTAL STUDIES OF STRAIN-MEDIATED EFFECTS IN THE THERMODYNAMICS AND KINETICS OF INTERFACES

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    In this dissertation, the Phase Field Crystal (PFC) Method is used to study a number of problems in which interfaces and elastic effects play important roles in alloys. In particular, the three topics covered in this work are grain boundary thermodynamics in alloys, dislocation-mediated formation of clusters in binary and ternary alloys, and solutal effects in explosive crystallization. Physical phenomena associated with grain boundaries, such as Read-Shockley-like behaviour and Gibbs adsorp- tion theorem, were shown to be accurately captured in both PFC- and XPFC-type models. In fact, a connection between the solute segregation behaviour and physical properties of the system—such as energy of mixing, mismatch, and undercooling—were shown. Also, grain boundary premelting was investigated. It was shown how solute can change the disjoining potential of a grain boundary and a mechanism for hysteresis in grain boundary premelting was discussed. Regarding the phenomenon of cluster formation, a general coexistence approach and a nucleation-like approach were used to describe the mechanism consistently with observations; the process is facilitated by lowering the energy increase associated with it. The final phenomenon studied was explosive crystallization. It was shown that the temperature oscillations due to unsteady motion of an interface could be captured with PFC-type models and that this behaviour leaves patterns, such as solute traces, in the material. The versatility of this PFC formalism was demonstrated by capturing the underlying physics and elucidating the role of misfit strain in altering interface oscillations during explosive crystallization. Finally, it was demonstrated in all projects how PFC model parameters relate to coarse-grained material properties, thereby connecting these phenomena on larger scales to atomistic-scale properties.Doctor of Philosophy (PhD
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