Selfconsistent Model of Photoconversion Efficiency for Multijunction Solar Cells

To accurately calculate efficiencies $\eta$ of experimentally produced multijunction solar cells (MJSCs) and optimize their parameters, we offer semi-analytical photoconversion formalism that incorporates radiative recombination, Shockley-Read-Hall (SRH) recombination, surface recombination at the front and back surfaces of the cells, recombination in the space charge region (SCR) and the recombination at the heterojunction boundaries. Selfconsistent balance between the MJSC temperature and efficiency was imposed by jointly solving the equations for the photocurrent, photovoltage, and heat balance. Finally, we incorporate into the formalism the effect of additional photocurrent decrease with subcell number increase. It is shown that for an experimentally observed Shockley-Read-Hall lifetimes, the effect of re-absorption and re-emission of photons on MJSC efficiency can be neglected for non-concentrated radiation conditions. A significant efficiency $\eta$ increase can be achieved by improving the heat dissipation using radiators and bringing the MJSC emissivity to unity, that is closer to black body radiation rather than grey body radiation. Our calculated efficiencies compare well with other numerical results available and are consistent with the experimentally achieved efficiencies. The formalism can be used to optimize parameters of MJSCs for maximum photoconversion efficiency.Comment: 40th IEEE Photovoltaic Specialists Conference, June 8-13, 2014, Denver, Colorado, III-V Epitaxy and Solar Cells, F30 16

On the issue of ohmicity of Schottky contacts

An analysis is made of the conditions for ohmic contacts realization in the case of Schottky contacts. Based on the classical notions about the mechanisms of current flow, we consider the generalized model of Schottky contact that takes into account the thermionic current of majority charge carriers and recombination current of minority charge carriers in Schottky contacts with a dielectric gap. An analysis of the results given by that model made it possible to obtain ohmicity criteria for Schottky contacts and compare the conditions for low injection level and ohmicity of Schottky contacts in the case of silicon-based contacts. It is shown that conditions for Schottky contact ohmicity do not coincide with those for p-n junctions.Comment: 20 pages, in Russian, 4 figure